Dependence of growth and property of YBa2Cu3O7-x coated conductors on the thickness of CeO2 buffer layer

Li Mei-Ya; Wang Jing; Liu Jun; Yu Ben-Fang; Guo Dong-Yun; Zhao Xing-Zhong

doi:10.7498/aps.57.3132

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Li Mei-Ya, Wang Jing, Liu Jun, Yu Ben-Fang, Guo Dong-Yun, Zhao Xing-Zhong. Dependence of growth and property of YBa2Cu3O7-x coated conductors on the thickness of CeO2 buffer layerJ. Acta Physica Sinica, 2008, 57(5): 3132-3137. DOI: 10.7498/aps.57.3132

Citation:

Li Mei-Ya, Wang Jing, Liu Jun, Yu Ben-Fang, Guo Dong-Yun, Zhao Xing-Zhong. Dependence of growth and property of YBa2Cu3O7-x coated conductors on the thickness of CeO2 buffer layerJ. Acta Physica Sinica, 2008, 57(5): 3132-3137. DOI: 10.7498/aps.57.3132

Citation:

Li Mei-Ya, Wang Jing, Liu Jun, Yu Ben-Fang, Guo Dong-Yun, Zhao Xing-Zhong. Dependence of growth and property of YBa2Cu3O7-x coated conductors on the thickness of CeO2 buffer layerJ. Acta Physica Sinica, 2008, 57(5): 3132-3137. DOI: 10.7498/aps.57.3132