Coupling scattering effect between grain boundary and point defect on the thermoelectric transport process in Co1-xNixSb3-ySey

Liu Wei-Shu; Zhang Bo-Ping; Li Jing-Feng; Zhang Hai-Long; Zhao Li-Dong

doi:10.7498/aps.57.3791

Search

x

Liu Wei-Shu, Zhang Bo-Ping, Li Jing-Feng, Zhang Hai-Long, Zhao Li-Dong. Coupling scattering effect between grain boundary and point defect on the thermoelectric transport process in Co1-xNixSb3-ySeyJ. Acta Physica Sinica, 2008, 57(6): 3791-3797. DOI: 10.7498/aps.57.3791

Citation:

Liu Wei-Shu, Zhang Bo-Ping, Li Jing-Feng, Zhang Hai-Long, Zhao Li-Dong. Coupling scattering effect between grain boundary and point defect on the thermoelectric transport process in Co1-xNixSb3-ySeyJ. Acta Physica Sinica, 2008, 57(6): 3791-3797. DOI: 10.7498/aps.57.3791

Citation:

Liu Wei-Shu, Zhang Bo-Ping, Li Jing-Feng, Zhang Hai-Long, Zhao Li-Dong. Coupling scattering effect between grain boundary and point defect on the thermoelectric transport process in Co1-xNixSb3-ySeyJ. Acta Physica Sinica, 2008, 57(6): 3791-3797. DOI: 10.7498/aps.57.3791