Stacking fault tetrahedra in single-crystal aluminum induced by high-current pulsed electron beam

Guan Qing-Feng; Chen Bo; Zhang Qing-Yu; Dong Chuang; Zou Guang-Tian

doi:10.7498/aps.57.392

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Guan Qing-Feng, Chen Bo, Zhang Qing-Yu, Dong Chuang, Zou Guang-Tian. Stacking fault tetrahedra in single-crystal aluminum induced by high-current pulsed electron beamJ. Acta Physica Sinica, 2008, 57(1): 392-397. DOI: 10.7498/aps.57.392

Citation:

Guan Qing-Feng, Chen Bo, Zhang Qing-Yu, Dong Chuang, Zou Guang-Tian. Stacking fault tetrahedra in single-crystal aluminum induced by high-current pulsed electron beamJ. Acta Physica Sinica, 2008, 57(1): 392-397. DOI: 10.7498/aps.57.392

Citation:

Guan Qing-Feng, Chen Bo, Zhang Qing-Yu, Dong Chuang, Zou Guang-Tian. Stacking fault tetrahedra in single-crystal aluminum induced by high-current pulsed electron beamJ. Acta Physica Sinica, 2008, 57(1): 392-397. DOI: 10.7498/aps.57.392