Li Yong-Hua, Liu Chang-Sheng, Meng Fan-Ling, Wang Yu-Ming, Zheng Wei-Tao. X-ray photoelectron spectroscopy analysis of the effect of thickness on the transformation temperature of NiTi alloy thin filmsJ. Acta Physica Sinica, 2009, 58(4): 2742-2745. DOI: 10.7498/aps.58.2742
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Citation:
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Li Yong-Hua, Liu Chang-Sheng, Meng Fan-Ling, Wang Yu-Ming, Zheng Wei-Tao. X-ray photoelectron spectroscopy analysis of the effect of thickness on the transformation temperature of NiTi alloy thin filmsJ. Acta Physica Sinica, 2009, 58(4): 2742-2745. DOI: 10.7498/aps.58.2742
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Li Yong-Hua, Liu Chang-Sheng, Meng Fan-Ling, Wang Yu-Ming, Zheng Wei-Tao. X-ray photoelectron spectroscopy analysis of the effect of thickness on the transformation temperature of NiTi alloy thin filmsJ. Acta Physica Sinica, 2009, 58(4): 2742-2745. DOI: 10.7498/aps.58.2742
|
Citation:
|
Li Yong-Hua, Liu Chang-Sheng, Meng Fan-Ling, Wang Yu-Ming, Zheng Wei-Tao. X-ray photoelectron spectroscopy analysis of the effect of thickness on the transformation temperature of NiTi alloy thin filmsJ. Acta Physica Sinica, 2009, 58(4): 2742-2745. DOI: 10.7498/aps.58.2742
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