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中国物理学会期刊
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Bai Yu-Hao, Yun Guo-Hong, B.Narsu. Effect of applied stress on exchange bias in ferromagnetic/antiferromagnetic bilayers and the phenomenon of the jumpJ. Acta Physica Sinica, 2009, 58(7): 4962-4969. DOI: 10.7498/aps.58.4962
Citation: Bai Yu-Hao, Yun Guo-Hong, B.Narsu. Effect of applied stress on exchange bias in ferromagnetic/antiferromagnetic bilayers and the phenomenon of the jumpJ. Acta Physica Sinica, 2009, 58(7): 4962-4969. DOI: 10.7498/aps.58.4962
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Effect of applied stress on exchange bias in ferromagnetic/antiferromagnetic bilayers and the phenomenon of the jump

Acta Phys. Sin., 2009, 58(7): 4962-4969.
DOI: 10.7498/aps.58.4962
CSTR: 32037.14.aps.58.4962
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