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中国物理学会期刊
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Li Wei, Li Bin-Cheng. Modulated free carrier absorption characterization of semiconductor wafers by frequency scans at different pump-to-probe separationsJ. Acta Physica Sinica, 2009, 58(9): 6506-6511. DOI: 10.7498/aps.58.6506
Citation: Li Wei, Li Bin-Cheng. Modulated free carrier absorption characterization of semiconductor wafers by frequency scans at different pump-to-probe separationsJ. Acta Physica Sinica, 2009, 58(9): 6506-6511. DOI: 10.7498/aps.58.6506
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Modulated free carrier absorption characterization of semiconductor wafers by frequency scans at different pump-to-probe separations

Acta Phys. Sin., 2009, 58(9): 6506-6511.
DOI: 10.7498/aps.58.6506
CSTR: 32037.14.aps.58.6506
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