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中国物理学会期刊
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Liu Xue-Qin, Han Guo-Jian, Huang Chun-Kui, Lan Wei. Thickness dependence of microstructure for La0.9Sr0.1MnO3/Si films determined by micro-Raman spectroscopyJ. Acta Physica Sinica, 2009, 58(11): 8008-8013. DOI: 10.7498/aps.58.8008
Citation: Liu Xue-Qin, Han Guo-Jian, Huang Chun-Kui, Lan Wei. Thickness dependence of microstructure for La0.9Sr0.1MnO3/Si films determined by micro-Raman spectroscopyJ. Acta Physica Sinica, 2009, 58(11): 8008-8013. DOI: 10.7498/aps.58.8008
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Thickness dependence of microstructure for La0.9Sr0.1MnO3/Si films determined by micro-Raman spectroscopy

Acta Phys. Sin., 2009, 58(11): 8008-8013.
DOI: 10.7498/aps.58.8008
CSTR: 32037.14.aps.58.8008
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