Optical constants of sol-gel derived TiO2 films characterized by spectroscopic ellipsometry

Wang Xiao-Dong; Shen Jun; Wang Sheng-Zhao; Zhang Zhi-Hua

doi:10.7498/aps.58.8027

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Wang Xiao-Dong, Shen Jun, Wang Sheng-Zhao, Zhang Zhi-Hua. Optical constants of sol-gel derived TiO2 films characterized by spectroscopic ellipsometryJ. Acta Physica Sinica, 2009, 58(11): 8027-8032. DOI: 10.7498/aps.58.8027

Citation:

Wang Xiao-Dong, Shen Jun, Wang Sheng-Zhao, Zhang Zhi-Hua. Optical constants of sol-gel derived TiO2 films characterized by spectroscopic ellipsometryJ. Acta Physica Sinica, 2009, 58(11): 8027-8032. DOI: 10.7498/aps.58.8027

Citation:

Wang Xiao-Dong, Shen Jun, Wang Sheng-Zhao, Zhang Zhi-Hua. Optical constants of sol-gel derived TiO2 films characterized by spectroscopic ellipsometryJ. Acta Physica Sinica, 2009, 58(11): 8027-8032. DOI: 10.7498/aps.58.8027