Experimental analysis of charge transfer efficiency degradation of charge coupled devices induced by proton irradiation

Wang Zu-Jun; Tang Ben-Qi; Xiao Zhi-Gang; Liu Min-Bo; Huang Shao-Yan; Zhang Yong

doi:10.7498/aps.59.4136

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Wang Zu-Jun, Tang Ben-Qi, Xiao Zhi-Gang, Liu Min-Bo, Huang Shao-Yan, Zhang Yong. Experimental analysis of charge transfer efficiency degradation of charge coupled devices induced by proton irradiationJ. Acta Physica Sinica, 2010, 59(6): 4136-4142. DOI: 10.7498/aps.59.4136

Citation:

Wang Zu-Jun, Tang Ben-Qi, Xiao Zhi-Gang, Liu Min-Bo, Huang Shao-Yan, Zhang Yong. Experimental analysis of charge transfer efficiency degradation of charge coupled devices induced by proton irradiationJ. Acta Physica Sinica, 2010, 59(6): 4136-4142. DOI: 10.7498/aps.59.4136

Citation:

Wang Zu-Jun, Tang Ben-Qi, Xiao Zhi-Gang, Liu Min-Bo, Huang Shao-Yan, Zhang Yong. Experimental analysis of charge transfer efficiency degradation of charge coupled devices induced by proton irradiationJ. Acta Physica Sinica, 2010, 59(6): 4136-4142. DOI: 10.7498/aps.59.4136