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中国物理学会期刊
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Zhang Jin-Song, Wu Yi-Ping, Wang Yong-Guo, Tao Yuan. Thermomigration in micro interconnects in integrated circuitsJ. Acta Physica Sinica, 2010, 59(6): 4395-4402. DOI: 10.7498/aps.59.4395
Citation: Zhang Jin-Song, Wu Yi-Ping, Wang Yong-Guo, Tao Yuan. Thermomigration in micro interconnects in integrated circuitsJ. Acta Physica Sinica, 2010, 59(6): 4395-4402. DOI: 10.7498/aps.59.4395
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Thermomigration in micro interconnects in integrated circuits

Acta Phys. Sin., 2010, 59(6): 4395-4402.
DOI: 10.7498/aps.59.4395
CSTR: 32037.14.aps.59.4395
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