Analysis of failure mechanism of GaN-based white light-emitting diode

Xue Zheng-Qun; Huang Sheng-Rong; Zhang Bao-Ping; Chen Chao

doi:10.7498/aps.59.5002

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Xue Zheng-Qun, Huang Sheng-Rong, Zhang Bao-Ping, Chen Chao. Analysis of failure mechanism of GaN-based white light-emitting diodeJ. Acta Physica Sinica, 2010, 59(7): 5002-5009. DOI: 10.7498/aps.59.5002

Citation:

Xue Zheng-Qun, Huang Sheng-Rong, Zhang Bao-Ping, Chen Chao. Analysis of failure mechanism of GaN-based white light-emitting diodeJ. Acta Physica Sinica, 2010, 59(7): 5002-5009. DOI: 10.7498/aps.59.5002

Citation:

Xue Zheng-Qun, Huang Sheng-Rong, Zhang Bao-Ping, Chen Chao. Analysis of failure mechanism of GaN-based white light-emitting diodeJ. Acta Physica Sinica, 2010, 59(7): 5002-5009. DOI: 10.7498/aps.59.5002