Zhao Li-Xia, Zhang He-Ming, Hu Hui-Yong, Dai Xian-Ying, Xuan Rong-Xi. Model of electronical conductivity effective mass of strained SiJ. Acta Physica Sinica, 2010, 59(9): 6545-6548. DOI: 10.7498/aps.59.6545
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Citation:
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Zhao Li-Xia, Zhang He-Ming, Hu Hui-Yong, Dai Xian-Ying, Xuan Rong-Xi. Model of electronical conductivity effective mass of strained SiJ. Acta Physica Sinica, 2010, 59(9): 6545-6548. DOI: 10.7498/aps.59.6545
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Zhao Li-Xia, Zhang He-Ming, Hu Hui-Yong, Dai Xian-Ying, Xuan Rong-Xi. Model of electronical conductivity effective mass of strained SiJ. Acta Physica Sinica, 2010, 59(9): 6545-6548. DOI: 10.7498/aps.59.6545
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Citation:
|
Zhao Li-Xia, Zhang He-Ming, Hu Hui-Yong, Dai Xian-Ying, Xuan Rong-Xi. Model of electronical conductivity effective mass of strained SiJ. Acta Physica Sinica, 2010, 59(9): 6545-6548. DOI: 10.7498/aps.59.6545
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