Study of structural and electrical properties of phase-change materials Ge1Sb2Te4 and Ge2Sb2Te5 thin films

Liao Yuan-Bao; Xu Ling; Yang Fei; Liu Wen-Qiang; Liu Dong; Xu Jun; Ma Zhong-Yuan; Chen Kun-Ji

doi:10.7498/aps.59.6563

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Liao Yuan-Bao, Xu Ling, Yang Fei, Liu Wen-Qiang, Liu Dong, Xu Jun, Ma Zhong-Yuan, Chen Kun-Ji. Study of structural and electrical properties of phase-change materials Ge1Sb2Te4 and Ge2Sb2Te5 thin filmsJ. Acta Physica Sinica, 2010, 59(9): 6563-6568. DOI: 10.7498/aps.59.6563

Citation:

Liao Yuan-Bao, Xu Ling, Yang Fei, Liu Wen-Qiang, Liu Dong, Xu Jun, Ma Zhong-Yuan, Chen Kun-Ji. Study of structural and electrical properties of phase-change materials Ge1Sb2Te4 and Ge2Sb2Te5 thin filmsJ. Acta Physica Sinica, 2010, 59(9): 6563-6568. DOI: 10.7498/aps.59.6563

Citation:

Liao Yuan-Bao, Xu Ling, Yang Fei, Liu Wen-Qiang, Liu Dong, Xu Jun, Ma Zhong-Yuan, Chen Kun-Ji. Study of structural and electrical properties of phase-change materials Ge1Sb2Te4 and Ge2Sb2Te5 thin filmsJ. Acta Physica Sinica, 2010, 59(9): 6563-6568. DOI: 10.7498/aps.59.6563