Study of zinc tin oxide thin-film transistor

Wang Xiong; Cai Xi-Kun; Yuan Zi-Jian; Zhu Xia-Ming; Qiu Dong-Jiang; Wu Hui-Zhen

doi:10.7498/aps.60.037305

Wang Xiong, Cai Xi-Kun, Yuan Zi-Jian, Zhu Xia-Ming, Qiu Dong-Jiang, Wu Hui-Zhen. Study of zinc tin oxide thin-film transistorJ. Acta Physica Sinica, 2011, 60(3): 037305. DOI: 10.7498/aps.60.037305

Citation:

Wang Xiong, Cai Xi-Kun, Yuan Zi-Jian, Zhu Xia-Ming, Qiu Dong-Jiang, Wu Hui-Zhen. Study of zinc tin oxide thin-film transistorJ. Acta Physica Sinica, 2011, 60(3): 037305. DOI: 10.7498/aps.60.037305

Citation:

Wang Xiong, Cai Xi-Kun, Yuan Zi-Jian, Zhu Xia-Ming, Qiu Dong-Jiang, Wu Hui-Zhen. Study of zinc tin oxide thin-film transistorJ. Acta Physica Sinica, 2011, 60(3): 037305. DOI: 10.7498/aps.60.037305