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中国物理学会期刊
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Bao Jun-Lin, Lin Li-Yan, He Liang, Du Lei. Noise as a characteriscic for current transmitting rateof optoelectronic coupled devicesfor ionization radiation damageJ. Acta Physica Sinica, 2011, 60(4): 047202. DOI: 10.7498/aps.60.047202
Citation: Bao Jun-Lin, Lin Li-Yan, He Liang, Du Lei. Noise as a characteriscic for current transmitting rateof optoelectronic coupled devicesfor ionization radiation damageJ. Acta Physica Sinica, 2011, 60(4): 047202. DOI: 10.7498/aps.60.047202
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Noise as a characteriscic for current transmitting rateof optoelectronic coupled devicesfor ionization radiation damage

Acta Phys. Sin., 2011, 60(4): 047202.
DOI: 10.7498/aps.60.047202
CSTR: 32037.14.aps.60.047202
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