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中国物理学会期刊
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Li Wei-Qin, Zhang Hai-Bo, Lu Jun. Charging effects of SiO2 thin films under defocused electron beam irradiationJ. Acta Physica Sinica, 2012, 61(2): 027302. DOI: 10.7498/aps.61.027302
Citation: Li Wei-Qin, Zhang Hai-Bo, Lu Jun. Charging effects of SiO2 thin films under defocused electron beam irradiationJ. Acta Physica Sinica, 2012, 61(2): 027302. DOI: 10.7498/aps.61.027302
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Charging effects of SiO2 thin films under defocused electron beam irradiation

Acta Phys. Sin., 2012, 61(2): 027302.
DOI: 10.7498/aps.61.027302
CSTR: 32037.14.aps.61.027302
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