Hu Zhi-Yuan, Liu Zhang-Li, Shao Hua, Zhang Zheng-Xuan, Ning Bing-Xu, Bi Da-Wei, Chen Ming, Zou Shi-Chang. The influence of channel length on total ionizing dose effect in deep submicron technologiesJ. Acta Physica Sinica, 2012, 61(5): 050702. DOI: 10.7498/aps.61.050702
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Citation:
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Hu Zhi-Yuan, Liu Zhang-Li, Shao Hua, Zhang Zheng-Xuan, Ning Bing-Xu, Bi Da-Wei, Chen Ming, Zou Shi-Chang. The influence of channel length on total ionizing dose effect in deep submicron technologiesJ. Acta Physica Sinica, 2012, 61(5): 050702. DOI: 10.7498/aps.61.050702
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Hu Zhi-Yuan, Liu Zhang-Li, Shao Hua, Zhang Zheng-Xuan, Ning Bing-Xu, Bi Da-Wei, Chen Ming, Zou Shi-Chang. The influence of channel length on total ionizing dose effect in deep submicron technologiesJ. Acta Physica Sinica, 2012, 61(5): 050702. DOI: 10.7498/aps.61.050702
|
Citation:
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Hu Zhi-Yuan, Liu Zhang-Li, Shao Hua, Zhang Zheng-Xuan, Ning Bing-Xu, Bi Da-Wei, Chen Ming, Zou Shi-Chang. The influence of channel length on total ionizing dose effect in deep submicron technologiesJ. Acta Physica Sinica, 2012, 61(5): 050702. DOI: 10.7498/aps.61.050702
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