Ma Jiao-Min, Liang Yan, Gao Xiao-Yong, Chen Chao, Zhao Meng-Ke, Lu Jing-Xiao. Spectroscopic ellipsometry study of the Ag2O film deposited by radio-frequency reactive magnetron sputteringJ. Acta Physica Sinica, 2012, 61(5): 056106. DOI: 10.7498/aps.61.056106
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Citation:
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Ma Jiao-Min, Liang Yan, Gao Xiao-Yong, Chen Chao, Zhao Meng-Ke, Lu Jing-Xiao. Spectroscopic ellipsometry study of the Ag2O film deposited by radio-frequency reactive magnetron sputteringJ. Acta Physica Sinica, 2012, 61(5): 056106. DOI: 10.7498/aps.61.056106
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Ma Jiao-Min, Liang Yan, Gao Xiao-Yong, Chen Chao, Zhao Meng-Ke, Lu Jing-Xiao. Spectroscopic ellipsometry study of the Ag2O film deposited by radio-frequency reactive magnetron sputteringJ. Acta Physica Sinica, 2012, 61(5): 056106. DOI: 10.7498/aps.61.056106
|
Citation:
|
Ma Jiao-Min, Liang Yan, Gao Xiao-Yong, Chen Chao, Zhao Meng-Ke, Lu Jing-Xiao. Spectroscopic ellipsometry study of the Ag2O film deposited by radio-frequency reactive magnetron sputteringJ. Acta Physica Sinica, 2012, 61(5): 056106. DOI: 10.7498/aps.61.056106
|
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