Zhang Pei-Jian, Meng Yang, Liu Zi-Yu, Pan Xin-Yu, Liang Xue-Jin, Chen Dong-Min, Zhao Hong-Wu. Influences of dislocation distribution on the resistive switching effect of Ag-SiO2 thin filmsJ. Acta Physica Sinica, 2012, 61(10): 107703. DOI: 10.7498/aps.61.107703
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Citation:
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Zhang Pei-Jian, Meng Yang, Liu Zi-Yu, Pan Xin-Yu, Liang Xue-Jin, Chen Dong-Min, Zhao Hong-Wu. Influences of dislocation distribution on the resistive switching effect of Ag-SiO2 thin filmsJ. Acta Physica Sinica, 2012, 61(10): 107703. DOI: 10.7498/aps.61.107703
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Zhang Pei-Jian, Meng Yang, Liu Zi-Yu, Pan Xin-Yu, Liang Xue-Jin, Chen Dong-Min, Zhao Hong-Wu. Influences of dislocation distribution on the resistive switching effect of Ag-SiO2 thin filmsJ. Acta Physica Sinica, 2012, 61(10): 107703. DOI: 10.7498/aps.61.107703
|
Citation:
|
Zhang Pei-Jian, Meng Yang, Liu Zi-Yu, Pan Xin-Yu, Liang Xue-Jin, Chen Dong-Min, Zhao Hong-Wu. Influences of dislocation distribution on the resistive switching effect of Ag-SiO2 thin filmsJ. Acta Physica Sinica, 2012, 61(10): 107703. DOI: 10.7498/aps.61.107703
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