A radiation degradation model of metal-oxide-semiconductor field effect transistor

Sun Peng; Du Lei; Chen Wen-Hao; He Liang; Zhang Xiao-Fang

doi:10.7498/aps.61.107803

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Sun Peng, Du Lei, Chen Wen-Hao, He Liang, Zhang Xiao-Fang. A radiation degradation model of metal-oxide-semiconductor field effect transistorJ. Acta Physica Sinica, 2012, 61(10): 107803. DOI: 10.7498/aps.61.107803

Citation:

Sun Peng, Du Lei, Chen Wen-Hao, He Liang, Zhang Xiao-Fang. A radiation degradation model of metal-oxide-semiconductor field effect transistorJ. Acta Physica Sinica, 2012, 61(10): 107803. DOI: 10.7498/aps.61.107803

Citation:

Sun Peng, Du Lei, Chen Wen-Hao, He Liang, Zhang Xiao-Fang. A radiation degradation model of metal-oxide-semiconductor field effect transistorJ. Acta Physica Sinica, 2012, 61(10): 107803. DOI: 10.7498/aps.61.107803