Radiation degradation mechanism of pn-junction diode based on 1/f noise variation

Sun Peng; Du Lei; He Liang; Chen Wen-Hao; Liu Yu-Dong; Zhao Ying

doi:10.7498/aps.61.127808

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Sun Peng, Du Lei, He Liang, Chen Wen-Hao, Liu Yu-Dong, Zhao Ying. Radiation degradation mechanism of pn-junction diode based on 1/f noise variationJ. Acta Physica Sinica, 2012, 61(12): 127808. DOI: 10.7498/aps.61.127808

Citation:

Sun Peng, Du Lei, He Liang, Chen Wen-Hao, Liu Yu-Dong, Zhao Ying. Radiation degradation mechanism of pn-junction diode based on 1/f noise variationJ. Acta Physica Sinica, 2012, 61(12): 127808. DOI: 10.7498/aps.61.127808

Citation:

Sun Peng, Du Lei, He Liang, Chen Wen-Hao, Liu Yu-Dong, Zhao Ying. Radiation degradation mechanism of pn-junction diode based on 1/f noise variationJ. Acta Physica Sinica, 2012, 61(12): 127808. DOI: 10.7498/aps.61.127808