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中国物理学会期刊
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Lin Xiao-Ling, Xiao Qing-Zhong, En Yun-Fei, Yao Ruo-He. Failure mechanism of FC-PBGA devices under external stressJ. Acta Physica Sinica, 2012, 61(12): 128502. DOI: 10.7498/aps.61.128502
Citation: Lin Xiao-Ling, Xiao Qing-Zhong, En Yun-Fei, Yao Ruo-He. Failure mechanism of FC-PBGA devices under external stressJ. Acta Physica Sinica, 2012, 61(12): 128502. DOI: 10.7498/aps.61.128502
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Failure mechanism of FC-PBGA devices under external stress

Acta Phys. Sin., 2012, 61(12): 128502.
DOI: 10.7498/aps.61.128502
CSTR: 32037.14.aps.61.128502
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