The effect of electrostatic discharge on the I-V and low frequency noise characterization of Schottky barrier diodes

Liu Yu-Dong; Du Lei; Sun Peng; Chen Wen-Hao

doi:10.7498/aps.61.137203

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Liu Yu-Dong, Du Lei, Sun Peng, Chen Wen-Hao. The effect of electrostatic discharge on the I-V and low frequency noise characterization of Schottky barrier diodesJ. Acta Physica Sinica, 2012, 61(13): 137203. DOI: 10.7498/aps.61.137203

Citation:

Liu Yu-Dong, Du Lei, Sun Peng, Chen Wen-Hao. The effect of electrostatic discharge on the I-V and low frequency noise characterization of Schottky barrier diodesJ. Acta Physica Sinica, 2012, 61(13): 137203. DOI: 10.7498/aps.61.137203

Citation:

Liu Yu-Dong, Du Lei, Sun Peng, Chen Wen-Hao. The effect of electrostatic discharge on the I-V and low frequency noise characterization of Schottky barrier diodesJ. Acta Physica Sinica, 2012, 61(13): 137203. DOI: 10.7498/aps.61.137203