Chen Xiao-Xue, Yao Ruo-He. DC characteristic research based on surface potential for a-Si:H thin-film transistorJ. Acta Physica Sinica, 2012, 61(23): 237104. DOI: 10.7498/aps.61.237104
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Citation:
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Chen Xiao-Xue, Yao Ruo-He. DC characteristic research based on surface potential for a-Si:H thin-film transistorJ. Acta Physica Sinica, 2012, 61(23): 237104. DOI: 10.7498/aps.61.237104
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Chen Xiao-Xue, Yao Ruo-He. DC characteristic research based on surface potential for a-Si:H thin-film transistorJ. Acta Physica Sinica, 2012, 61(23): 237104. DOI: 10.7498/aps.61.237104
|
Citation:
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Chen Xiao-Xue, Yao Ruo-He. DC characteristic research based on surface potential for a-Si:H thin-film transistorJ. Acta Physica Sinica, 2012, 61(23): 237104. DOI: 10.7498/aps.61.237104
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