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中国物理学会期刊
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Bi Juan, Jin Guang-Yong, Ni Xiao-Wu, Zhang Xi-He, Yao Zhi-Jian. Analysis of 532nm long pulse laser-induced thermal decomposition damage to GaAs by semi-analytical methodJ. Acta Physica Sinica, 2012, 61(24): 244209. DOI: 10.7498/aps.61.244209
Citation: Bi Juan, Jin Guang-Yong, Ni Xiao-Wu, Zhang Xi-He, Yao Zhi-Jian. Analysis of 532nm long pulse laser-induced thermal decomposition damage to GaAs by semi-analytical methodJ. Acta Physica Sinica, 2012, 61(24): 244209. DOI: 10.7498/aps.61.244209
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Analysis of 532nm long pulse laser-induced thermal decomposition damage to GaAs by semi-analytical method

Acta Phys. Sin., 2012, 61(24): 244209.
DOI: 10.7498/aps.61.244209
CSTR: 32037.14.aps.61.244209
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