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Cao Lei, Liu Hong-Xia. Study of the SOI MOSFET characteristics of high-k gate dielectric with quantum effectJ. Acta Physica Sinica, 2012, 61(24): 247303. DOI: 10.7498/aps.61.247303
Citation: Cao Lei, Liu Hong-Xia. Study of the SOI MOSFET characteristics of high-k gate dielectric with quantum effectJ. Acta Physica Sinica, 2012, 61(24): 247303. DOI: 10.7498/aps.61.247303
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Study of the SOI MOSFET characteristics of high-k gate dielectric with quantum effect

Acta Phys. Sin., 2012, 61(24): 247303.
DOI: 10.7498/aps.61.247303
CSTR: 32037.14.aps.61.247303
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