Rapid identification of the consistency of failure mechanism for constant temperature stress accelerated testing

Guo Chun-Sheng; Wan Ning; Ma Wei-Dong; Zhang Yan-Feng; Xiong Cong; Feng Shi-Wei

doi:10.7498/aps.62.068502

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Guo Chun-Sheng, Wan Ning, Ma Wei-Dong, Zhang Yan-Feng, Xiong Cong, Feng Shi-Wei. Rapid identification of the consistency of failure mechanism for constant temperature stress accelerated testingJ. Acta Physica Sinica, 2013, 62(6): 068502. DOI: 10.7498/aps.62.068502

Citation:

Guo Chun-Sheng, Wan Ning, Ma Wei-Dong, Zhang Yan-Feng, Xiong Cong, Feng Shi-Wei. Rapid identification of the consistency of failure mechanism for constant temperature stress accelerated testingJ. Acta Physica Sinica, 2013, 62(6): 068502. DOI: 10.7498/aps.62.068502

Citation:

Guo Chun-Sheng, Wan Ning, Ma Wei-Dong, Zhang Yan-Feng, Xiong Cong, Feng Shi-Wei. Rapid identification of the consistency of failure mechanism for constant temperature stress accelerated testingJ. Acta Physica Sinica, 2013, 62(6): 068502. DOI: 10.7498/aps.62.068502