Tian Jing, Yang Xing, Liu Shang-Jun, Lian Xiao-Juan, Chen Jin-Wei, Wang Rui-Lin. Effect of thickness on the properties of Cu(Inx,Ga1-x)Se2 back conduct Mo thin films prepared by DC sputteringJ. Acta Physica Sinica, 2013, 62(11): 116801. DOI: 10.7498/aps.62.116801
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Citation:
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Tian Jing, Yang Xing, Liu Shang-Jun, Lian Xiao-Juan, Chen Jin-Wei, Wang Rui-Lin. Effect of thickness on the properties of Cu(Inx,Ga1-x)Se2 back conduct Mo thin films prepared by DC sputteringJ. Acta Physica Sinica, 2013, 62(11): 116801. DOI: 10.7498/aps.62.116801
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Tian Jing, Yang Xing, Liu Shang-Jun, Lian Xiao-Juan, Chen Jin-Wei, Wang Rui-Lin. Effect of thickness on the properties of Cu(Inx,Ga1-x)Se2 back conduct Mo thin films prepared by DC sputteringJ. Acta Physica Sinica, 2013, 62(11): 116801. DOI: 10.7498/aps.62.116801
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Citation:
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Tian Jing, Yang Xing, Liu Shang-Jun, Lian Xiao-Juan, Chen Jin-Wei, Wang Rui-Lin. Effect of thickness on the properties of Cu(Inx,Ga1-x)Se2 back conduct Mo thin films prepared by DC sputteringJ. Acta Physica Sinica, 2013, 62(11): 116801. DOI: 10.7498/aps.62.116801
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