Influences of electrode separation on structural properties of μc-Si1-xGex：H thin films

Cao Yu; Zhang Jian-Jun; Yan Gan-Gui; Ni Jian; Li Tian-Wei; Huang Zhen-Hua; Zhao Ying

doi:10.7498/aps.63.076801

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Cao Yu, Zhang Jian-Jun, Yan Gan-Gui, Ni Jian, Li Tian-Wei, Huang Zhen-Hua, Zhao Ying. Influences of electrode separation on structural properties of μc-Si1-xGex：H thin filmsJ. Acta Physica Sinica, 2014, 63(7): 076801. DOI: 10.7498/aps.63.076801

Citation:

Cao Yu, Zhang Jian-Jun, Yan Gan-Gui, Ni Jian, Li Tian-Wei, Huang Zhen-Hua, Zhao Ying. Influences of electrode separation on structural properties of μc-Si1-xGex：H thin filmsJ. Acta Physica Sinica, 2014, 63(7): 076801. DOI: 10.7498/aps.63.076801

Citation:

Cao Yu, Zhang Jian-Jun, Yan Gan-Gui, Ni Jian, Li Tian-Wei, Huang Zhen-Hua, Zhao Ying. Influences of electrode separation on structural properties of μc-Si1-xGex：H thin filmsJ. Acta Physica Sinica, 2014, 63(7): 076801. DOI: 10.7498/aps.63.076801