Analysis of low-frequency noise in the amorphous indium zinc oxide thin film transistors

Liu Yuan; Wu Wei-Jing; Li Bin; En Yun-Fei; Wang Lei; Liu Yu-Rong

doi:10.7498/aps.63.098503

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Liu Yuan, Wu Wei-Jing, Li Bin, En Yun-Fei, Wang Lei, Liu Yu-Rong. Analysis of low-frequency noise in the amorphous indium zinc oxide thin film transistorsJ. Acta Physica Sinica, 2014, 63(9): 098503. DOI: 10.7498/aps.63.098503

Citation:

Liu Yuan, Wu Wei-Jing, Li Bin, En Yun-Fei, Wang Lei, Liu Yu-Rong. Analysis of low-frequency noise in the amorphous indium zinc oxide thin film transistorsJ. Acta Physica Sinica, 2014, 63(9): 098503. DOI: 10.7498/aps.63.098503

Citation:

Liu Yuan, Wu Wei-Jing, Li Bin, En Yun-Fei, Wang Lei, Liu Yu-Rong. Analysis of low-frequency noise in the amorphous indium zinc oxide thin film transistorsJ. Acta Physica Sinica, 2014, 63(9): 098503. DOI: 10.7498/aps.63.098503