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中国物理学会期刊
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Wang Jiang-Jing, Shao Rui-Wen, Deng Qing-Song, Zheng Kun. Study on electrical transport properties of strained Si nanowires by in situ transmission electron microscopeJ. Acta Physica Sinica, 2014, 63(11): 117303. DOI: 10.7498/aps.63.117303
Citation: Wang Jiang-Jing, Shao Rui-Wen, Deng Qing-Song, Zheng Kun. Study on electrical transport properties of strained Si nanowires by in situ transmission electron microscopeJ. Acta Physica Sinica, 2014, 63(11): 117303. DOI: 10.7498/aps.63.117303
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Study on electrical transport properties of strained Si nanowires by in situ transmission electron microscope

Acta Phys. Sin., 2014, 63(11): 117303.
DOI: 10.7498/aps.63.117303
CSTR: 32037.14.aps.63.117303
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