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Pang Hua, Deng Ning. Electric characteristics and resistive switching mechanism of Ni/HfO2/Pt resistive random access memory cellJ. Acta Physica Sinica, 2014, 63(14): 147301. DOI: 10.7498/aps.63.147301
Citation: Pang Hua, Deng Ning. Electric characteristics and resistive switching mechanism of Ni/HfO2/Pt resistive random access memory cellJ. Acta Physica Sinica, 2014, 63(14): 147301. DOI: 10.7498/aps.63.147301
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Electric characteristics and resistive switching mechanism of Ni/HfO2/Pt resistive random access memory cell

Acta Phys. Sin., 2014, 63(14): 147301.
DOI: 10.7498/aps.63.147301
CSTR: 32037.14.aps.63.147301
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