Suppression of secondary electron emission by micro-trapping structure surface

Ye Ming; He Yong-Ning; Wang Rui; Hu Tian-Cun; Zhang Na; Yang Jing; Cui Wan-Zhao; Zhang Zhong-Bing

doi:10.7498/aps.63.147901

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Ye Ming, He Yong-Ning, Wang Rui, Hu Tian-Cun, Zhang Na, Yang Jing, Cui Wan-Zhao, Zhang Zhong-Bing. Suppression of secondary electron emission by micro-trapping structure surfaceJ. Acta Physica Sinica, 2014, 63(14): 147901. DOI: 10.7498/aps.63.147901

Citation:

Ye Ming, He Yong-Ning, Wang Rui, Hu Tian-Cun, Zhang Na, Yang Jing, Cui Wan-Zhao, Zhang Zhong-Bing. Suppression of secondary electron emission by micro-trapping structure surfaceJ. Acta Physica Sinica, 2014, 63(14): 147901. DOI: 10.7498/aps.63.147901

Citation:

Ye Ming, He Yong-Ning, Wang Rui, Hu Tian-Cun, Zhang Na, Yang Jing, Cui Wan-Zhao, Zhang Zhong-Bing. Suppression of secondary electron emission by micro-trapping structure surfaceJ. Acta Physica Sinica, 2014, 63(14): 147901. DOI: 10.7498/aps.63.147901