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中国物理学会期刊
Xiong Ying, Wen Qi-Ye, Tian Wei, Mao Qi, Chen Zhi, Yang Qing-Hui, Jing Yu-Lan. Researches on the electrical properties of vanadium oxide thin films on Si substratesJ. Acta Physica Sinica, 2015, 64(1): 017102. DOI: 10.7498/aps.64.017102
Citation: Xiong Ying, Wen Qi-Ye, Tian Wei, Mao Qi, Chen Zhi, Yang Qing-Hui, Jing Yu-Lan. Researches on the electrical properties of vanadium oxide thin films on Si substratesJ. Acta Physica Sinica, 2015, 64(1): 017102. DOI: 10.7498/aps.64.017102

Researches on the electrical properties of vanadium oxide thin films on Si substrates

CSTR: 32037.14.aps.64.017102
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