Guo Chun-Sheng, Wang Lin, Zhai Yu-Wei, Li Rui, Feng Shi-Wei, Zhu Hui. Bending phenomenon of temperature calibration curve in junction temperature measurement by the high transient currentJ. Acta Physica Sinica, 2015, 64(18): 184704. DOI: 10.7498/aps.64.184704
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Citation:
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Guo Chun-Sheng, Wang Lin, Zhai Yu-Wei, Li Rui, Feng Shi-Wei, Zhu Hui. Bending phenomenon of temperature calibration curve in junction temperature measurement by the high transient currentJ. Acta Physica Sinica, 2015, 64(18): 184704. DOI: 10.7498/aps.64.184704
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Guo Chun-Sheng, Wang Lin, Zhai Yu-Wei, Li Rui, Feng Shi-Wei, Zhu Hui. Bending phenomenon of temperature calibration curve in junction temperature measurement by the high transient currentJ. Acta Physica Sinica, 2015, 64(18): 184704. DOI: 10.7498/aps.64.184704
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Citation:
|
Guo Chun-Sheng, Wang Lin, Zhai Yu-Wei, Li Rui, Feng Shi-Wei, Zhu Hui. Bending phenomenon of temperature calibration curve in junction temperature measurement by the high transient currentJ. Acta Physica Sinica, 2015, 64(18): 184704. DOI: 10.7498/aps.64.184704
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