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中国物理学会期刊
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Jiang Ran, Du Xiang-Hao, Han Zu-Yin, Sun Wei-Deng. Cluster distribution for oxygen vacancy in Ti/HfO2/Pt resistive switching memory deviceJ. Acta Physica Sinica, 2015, 64(20): 207302. DOI: 10.7498/aps.64.207302
Citation: Jiang Ran, Du Xiang-Hao, Han Zu-Yin, Sun Wei-Deng. Cluster distribution for oxygen vacancy in Ti/HfO2/Pt resistive switching memory deviceJ. Acta Physica Sinica, 2015, 64(20): 207302. DOI: 10.7498/aps.64.207302
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Cluster distribution for oxygen vacancy in Ti/HfO2/Pt resistive switching memory device

Acta Phys. Sin., 2015, 64(20): 207302.
DOI: 10.7498/aps.64.207302
CSTR: 32037.14.aps.64.207302
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