Wang Fan, Li Yu-Dong, Guo Qi, Wang Bo, Zhang Xing-Yao, Wen Lin, He Cheng-Fa. Total ionizing dose radiation effects in foue-transistor complementary metal oxide semiconductor image sensorsJ. Acta Physica Sinica, 2016, 65(2): 024212. DOI: 10.7498/aps.65.024212
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Citation:
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Wang Fan, Li Yu-Dong, Guo Qi, Wang Bo, Zhang Xing-Yao, Wen Lin, He Cheng-Fa. Total ionizing dose radiation effects in foue-transistor complementary metal oxide semiconductor image sensorsJ. Acta Physica Sinica, 2016, 65(2): 024212. DOI: 10.7498/aps.65.024212
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Wang Fan, Li Yu-Dong, Guo Qi, Wang Bo, Zhang Xing-Yao, Wen Lin, He Cheng-Fa. Total ionizing dose radiation effects in foue-transistor complementary metal oxide semiconductor image sensorsJ. Acta Physica Sinica, 2016, 65(2): 024212. DOI: 10.7498/aps.65.024212
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Citation:
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Wang Fan, Li Yu-Dong, Guo Qi, Wang Bo, Zhang Xing-Yao, Wen Lin, He Cheng-Fa. Total ionizing dose radiation effects in foue-transistor complementary metal oxide semiconductor image sensorsJ. Acta Physica Sinica, 2016, 65(2): 024212. DOI: 10.7498/aps.65.024212
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