Search

x
中国物理学会期刊
Advanced Search
Guo Zhao-Long, Zhao Hai-Xin, Zhao Wei. Preparation and characterization of self-cleaning and anti-reflection ZnO-SiO2 nanometric filmsJ. Acta Physica Sinica, 2016, 65(6): 064206. DOI: 10.7498/aps.65.064206
Citation: Guo Zhao-Long, Zhao Hai-Xin, Zhao Wei. Preparation and characterization of self-cleaning and anti-reflection ZnO-SiO2 nanometric filmsJ. Acta Physica Sinica, 2016, 65(6): 064206. DOI: 10.7498/aps.65.064206
shu

Preparation and characterization of self-cleaning and anti-reflection ZnO-SiO2 nanometric films

Acta Phys. Sin., 2016, 65(6): 064206.
DOI: 10.7498/aps.65.064206
CSTR: 32037.14.aps.65.064206
PDF
导出引用

  • Abstract

    Authors and contacts

    References

Turn off MathJax
Article Contents

Catalog

    /

    DownLoad:  Full-Size Img  PowerPoint
    Return
    Return