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中国物理学会期刊
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Wang Pan-Pan, Zhang Yu-Zhi, Peng Ming-Dong, Zhang Yun-Long, Wu Ling-Nan, Cao Yun-Zhen, Song Li-Xin. Spectroscopic ellipsometry analysis of vanadium oxide film in Vis-NIR and NIR-MIRJ. Acta Physica Sinica, 2016, 65(12): 127201. DOI: 10.7498/aps.65.127201
Citation: Wang Pan-Pan, Zhang Yu-Zhi, Peng Ming-Dong, Zhang Yun-Long, Wu Ling-Nan, Cao Yun-Zhen, Song Li-Xin. Spectroscopic ellipsometry analysis of vanadium oxide film in Vis-NIR and NIR-MIRJ. Acta Physica Sinica, 2016, 65(12): 127201. DOI: 10.7498/aps.65.127201
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Spectroscopic ellipsometry analysis of vanadium oxide film in Vis-NIR and NIR-MIR

Acta Phys. Sin., 2016, 65(12): 127201.
DOI: 10.7498/aps.65.127201
CSTR: 32037.14.aps.65.127201
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