Characterization of effective conductive layer of nano organic thin film using reflectance spectroscopy

Hou Yan-Jie; Hu Chun-Guang; Zhang Lei; Chen Xue-Jiao; Fu Xing; Hu Xiao-Tang

doi:10.7498/aps.65.200201

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Hou Yan-Jie, Hu Chun-Guang, Zhang Lei, Chen Xue-Jiao, Fu Xing, Hu Xiao-Tang. Characterization of effective conductive layer of nano organic thin film using reflectance spectroscopyJ. Acta Physica Sinica, 2016, 65(20): 200201. DOI: 10.7498/aps.65.200201

Citation:

Hou Yan-Jie, Hu Chun-Guang, Zhang Lei, Chen Xue-Jiao, Fu Xing, Hu Xiao-Tang. Characterization of effective conductive layer of nano organic thin film using reflectance spectroscopyJ. Acta Physica Sinica, 2016, 65(20): 200201. DOI: 10.7498/aps.65.200201

Citation:

Hou Yan-Jie, Hu Chun-Guang, Zhang Lei, Chen Xue-Jiao, Fu Xing, Hu Xiao-Tang. Characterization of effective conductive layer of nano organic thin film using reflectance spectroscopyJ. Acta Physica Sinica, 2016, 65(20): 200201. DOI: 10.7498/aps.65.200201