Total dose dependence of hot carrier injection effect in the n-channel metal oxide semiconductor devices

He Yu-Juan; Zhang Xiao-Wen; Liu Yuan

doi:10.7498/aps.65.246101

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He Yu-Juan, Zhang Xiao-Wen, Liu Yuan. Total dose dependence of hot carrier injection effect in the n-channel metal oxide semiconductor devicesJ. Acta Physica Sinica, 2016, 65(24): 246101. DOI: 10.7498/aps.65.246101

Citation:

He Yu-Juan, Zhang Xiao-Wen, Liu Yuan. Total dose dependence of hot carrier injection effect in the n-channel metal oxide semiconductor devicesJ. Acta Physica Sinica, 2016, 65(24): 246101. DOI: 10.7498/aps.65.246101

Citation:

He Yu-Juan, Zhang Xiao-Wen, Liu Yuan. Total dose dependence of hot carrier injection effect in the n-channel metal oxide semiconductor devicesJ. Acta Physica Sinica, 2016, 65(24): 246101. DOI: 10.7498/aps.65.246101