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中国物理学会期刊
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Zhang Cun-Bo, Yan Tao, Yang Zhi-Qiang, Ren Wei-Tao, Zhu Zhan-Ping. heoretical model of influence of frequency on thermal breakdown in semiconductor deviceJ. Acta Physica Sinica, 2017, 66(1): 018501. DOI: 10.7498/aps.66.018501
Citation: Zhang Cun-Bo, Yan Tao, Yang Zhi-Qiang, Ren Wei-Tao, Zhu Zhan-Ping. heoretical model of influence of frequency on thermal breakdown in semiconductor deviceJ. Acta Physica Sinica, 2017, 66(1): 018501. DOI: 10.7498/aps.66.018501
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heoretical model of influence of frequency on thermal breakdown in semiconductor device

Acta Phys. Sin., 2017, 66(1): 018501.
DOI: 10.7498/aps.66.018501
CSTR: 32037.14.aps.66.018501
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