Finite element analysis and experimental study on electrical damage of silicon photodiode induced by millisecond pulse laser

Zhao Hong-Yu; Wang Di; Wei Zhi; Jin Guang-Yong

doi:10.7498/aps.66.104203

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Zhao Hong-Yu, Wang Di, Wei Zhi, Jin Guang-Yong. Finite element analysis and experimental study on electrical damage of silicon photodiode induced by millisecond pulse laserJ. Acta Physica Sinica, 2017, 66(10): 104203. DOI: 10.7498/aps.66.104203

Citation:

Zhao Hong-Yu, Wang Di, Wei Zhi, Jin Guang-Yong. Finite element analysis and experimental study on electrical damage of silicon photodiode induced by millisecond pulse laserJ. Acta Physica Sinica, 2017, 66(10): 104203. DOI: 10.7498/aps.66.104203

Citation:

Zhao Hong-Yu, Wang Di, Wei Zhi, Jin Guang-Yong. Finite element analysis and experimental study on electrical damage of silicon photodiode induced by millisecond pulse laserJ. Acta Physica Sinica, 2017, 66(10): 104203. DOI: 10.7498/aps.66.104203