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中国物理学会期刊
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Li Tong-Kai, Xu Zheng, Zhao Su-Ling, Xu Xu-Rong, Xue Jun-Ming. Structural and optoelectronic properties of p-type SiO:H films deposited in transition zoneJ. Acta Physica Sinica, 2017, 66(19): 196801. DOI: 10.7498/aps.66.196801
Citation: Li Tong-Kai, Xu Zheng, Zhao Su-Ling, Xu Xu-Rong, Xue Jun-Ming. Structural and optoelectronic properties of p-type SiO:H films deposited in transition zoneJ. Acta Physica Sinica, 2017, 66(19): 196801. DOI: 10.7498/aps.66.196801
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Structural and optoelectronic properties of p-type SiO:H films deposited in transition zone

Acta Phys. Sin., 2017, 66(19): 196801.
DOI: 10.7498/aps.66.196801
CSTR: 32037.14.aps.66.196801
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