High-efficiency on-line measurement of junction temperature based on bipolar transistors in accelerated experiment

Guo Chun-Sheng; Ding Yan; Jiang Bo-Yang; Liao Zhi-Heng; Su Ya; Feng Shi-Wei

doi:10.7498/aps.66.224703

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Guo Chun-Sheng, Ding Yan, Jiang Bo-Yang, Liao Zhi-Heng, Su Ya, Feng Shi-Wei. High-efficiency on-line measurement of junction temperature based on bipolar transistors in accelerated experimentJ. Acta Physica Sinica, 2017, 66(22): 224703. DOI: 10.7498/aps.66.224703

Citation:

Guo Chun-Sheng, Ding Yan, Jiang Bo-Yang, Liao Zhi-Heng, Su Ya, Feng Shi-Wei. High-efficiency on-line measurement of junction temperature based on bipolar transistors in accelerated experimentJ. Acta Physica Sinica, 2017, 66(22): 224703. DOI: 10.7498/aps.66.224703

Citation:

Guo Chun-Sheng, Ding Yan, Jiang Bo-Yang, Liao Zhi-Heng, Su Ya, Feng Shi-Wei. High-efficiency on-line measurement of junction temperature based on bipolar transistors in accelerated experimentJ. Acta Physica Sinica, 2017, 66(22): 224703. DOI: 10.7498/aps.66.224703