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中国物理学会期刊
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Liu Ru-Xin, Dong Rui-Xin, Yan Xun-Ling, Xiao Xia. Memory capacitance behavior at single resistance state in memristor and multi-state characteristicJ. Acta Physica Sinica, 2019, 68(6): 068502. DOI: 10.7498/aps.68.20181836
Citation: Liu Ru-Xin, Dong Rui-Xin, Yan Xun-Ling, Xiao Xia. Memory capacitance behavior at single resistance state in memristor and multi-state characteristicJ. Acta Physica Sinica, 2019, 68(6): 068502. DOI: 10.7498/aps.68.20181836
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Memory capacitance behavior at single resistance state in memristor and multi-state characteristic

Acta Phys. Sin., 2019, 68(6): 068502.
DOI: 10.7498/aps.68.20181836
CSTR: 32037.14.aps.68.20181836
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