Prediction of proton single event upset sensitivity based on heavy ion test data in nanometer hardened static random access memory

Luo Yin-Hong; Zhang Feng-Qi; Guo Hong-Xia; Wojtek Hajdas

doi:10.7498/aps.69.20190878

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Luo Yin-Hong, Zhang Feng-Qi, Guo Hong-Xia, Wojtek Hajdas. Prediction of proton single event upset sensitivity based on heavy ion test data in nanometer hardened static random access memoryJ. Acta Physica Sinica, 2020, 69(1): 018501. DOI: 10.7498/aps.69.20190878

Citation:

Luo Yin-Hong, Zhang Feng-Qi, Guo Hong-Xia, Wojtek Hajdas. Prediction of proton single event upset sensitivity based on heavy ion test data in nanometer hardened static random access memoryJ. Acta Physica Sinica, 2020, 69(1): 018501. DOI: 10.7498/aps.69.20190878

Citation:

Luo Yin-Hong, Zhang Feng-Qi, Guo Hong-Xia, Wojtek Hajdas. Prediction of proton single event upset sensitivity based on heavy ion test data in nanometer hardened static random access memoryJ. Acta Physica Sinica, 2020, 69(1): 018501. DOI: 10.7498/aps.69.20190878