Search

x
中国物理学会期刊
Advanced Search
Zhang Meng, Yao Ruo-He, Liu Yu-Rong. A channel thermal noise model of nanoscaled metal-oxide-semiconductor field-effect transistorJ. Acta Physica Sinica, 2020, 69(5): 057101. DOI: 10.7498/aps.69.20191512
Citation: Zhang Meng, Yao Ruo-He, Liu Yu-Rong. A channel thermal noise model of nanoscaled metal-oxide-semiconductor field-effect transistorJ. Acta Physica Sinica, 2020, 69(5): 057101. DOI: 10.7498/aps.69.20191512
shu

A channel thermal noise model of nanoscaled metal-oxide-semiconductor field-effect transistor

Acta Phys. Sin., 2020, 69(5): 057101.
DOI: 10.7498/aps.69.20191512
CSTR: 32037.14.aps.69.20191512
PDF
HTML
导出引用

  • Abstract

    Authors and contacts

    References

Turn off MathJax
Article Contents

Catalog

    /

    DownLoad:  Full-Size Img  PowerPoint
    Return
    Return