A new method for identifying TE<sub>01δ</sub> mode during microwave dielectric measurements of low-loss materials

Li Lei; Yan Han; Chen Xiang-Ming

doi:10.7498/aps.69.20200275

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Li Lei, Yan Han, Chen Xiang-Ming. A new method for identifying TE01δ mode during microwave dielectric measurements of low-loss materialsJ. Acta Physica Sinica, 2020, 69(12): 128401. DOI: 10.7498/aps.69.20200275

Citation:

Li Lei, Yan Han, Chen Xiang-Ming. A new method for identifying TE01δ mode during microwave dielectric measurements of low-loss materialsJ. Acta Physica Sinica, 2020, 69(12): 128401. DOI: 10.7498/aps.69.20200275

Citation:

Li Lei, Yan Han, Chen Xiang-Ming. A new method for identifying TE01δ mode during microwave dielectric measurements of low-loss materialsJ. Acta Physica Sinica, 2020, 69(12): 128401. DOI: 10.7498/aps.69.20200275