Research progress of the investigation of intrinsic and extrinsic origin of piezoelectric materials by X-ray diffraction

Zhang Guan-Jie; Yang Hao; Zhang Nan

doi:10.7498/aps.69.20200301

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Zhang Guan-Jie, Yang Hao, Zhang Nan. Research progress of the investigation of intrinsic and extrinsic origin of piezoelectric materials by X-ray diffractionJ. Acta Physica Sinica, 2020, 69(12): 127711. DOI: 10.7498/aps.69.20200301

Citation:

Zhang Guan-Jie, Yang Hao, Zhang Nan. Research progress of the investigation of intrinsic and extrinsic origin of piezoelectric materials by X-ray diffractionJ. Acta Physica Sinica, 2020, 69(12): 127711. DOI: 10.7498/aps.69.20200301

Citation:

Zhang Guan-Jie, Yang Hao, Zhang Nan. Research progress of the investigation of intrinsic and extrinsic origin of piezoelectric materials by X-ray diffractionJ. Acta Physica Sinica, 2020, 69(12): 127711. DOI: 10.7498/aps.69.20200301